X-ray absorption in the analysis of residual stresses in samples with cylindrical geometry
Keywords:
X-ray diffractometry, absorption, residual stresses, cylindrical geometry, data fittingAbstract
In this paper the influence of sample geometry on taking into account the X-ray absorption when passing through the sample is investigated. The paper deals with the case of cylindrical geometry. For this case the theoretical description of absorption in the samples with such a geometry is carried out. The obtained theoretical expressions were used for taking into account the absorption of X-rays in iron wires in the analysis of residual stresses. With the help of X-ray diffractometry diffraction profiles under various tilt and rotation angles of diffraction vector with respect to sample normal were obtained. The experimental profiles were fitted by the linear dependence since in this investigation the samples are supposed to be isotropic. On the basis of the results of fitting procedure the components of stress tensor were determined. It was established that there exist some deviations from linear dependence. It can be related to the presence of anisotropy of the sample because of texture or direction dependent grain interaction. It follows that for more rigorous description of the experimentally obtained dependencies it is necessary to consider the samples anisotropic and to supply the analysis of residual stresses with corresponding theory.
References
- Atienza J. M., Martinez-Perez M. L., Ruiz-Hervias J., et al. Residual stresses in cold drawn ferritic rods. Scripta Mater. 2005. Vol. 52, issue 4. P. 305–309. DOI: 10.1016/j.scriptamat.2004.10.010.
- Ghelichi R., Bagherifard S., MacDonald D., et al. Experimental and numerical study of residual stress evolution in cold spray coating. Appl. Surf. Sci. 2014. Vol. 288. P. 26–33. DOI: 10.1016/j.apsusc.2013.09.074.
- Elices M. Influence of residual stresses in the performance of cold-drawn pearlitic wires. J. Mater. Sci. 2004. Vol. 39, issue 12. P. 3889–3899. DOI: 10.1023/B:JMSC.0000031470.31354.b5.
- Welzel U., Ligot J., Lamparter P., et al. Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction. J. Appl. Cryst. 2005. Vol. 38, part 1. P. 1–29. DOI: 10.1107/S0021889804029516.
- Welzel U., Mittemeijer E. J. Diffraction stress analysis of macroscopically elastically anisotropic specimens: on the concepts of diffraction elastic constants and stress factors. J. Appl. Phys. 2003. Vol. 93, issue 11. P. 9001–9011. DOI: 10.1063/1.1569662.
- Francois M., Dionnet B., Sprauel J. M., et al. The influence of cylindrical geometry on X-ray stress ensor analysis. General formulation. J. Appl. Cryst. 1995. Vol. 28, part 6. P. 761–767. DOI: 10.1107/S0021889895006868.
- Dionnet B., Francois M., Sprauel J. M., et al. The influence of cylindrical geometry on X-ray stress tensor analysis. Applications. J. Appl. Cryst. 1999. Vol. 32, part 5. P. 883–891. DOI: 10.1107/S0021889899003829.
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