Formation of epitaxial 3C-SiC layers on Si by rapid vacuum thermal processing

Authors

  • Mikhail V. Lobanok Belarusian State University, 4 Niezaliežnasci Avenue, Minsk 220030, Belarus
  • Stanislau L. Prakopyeu Belarusian State University, 4 Niezaliežnasci Avenue, Minsk 220030, Belarus
  • Maksim  A. Makhavikou A. N. Sevchenko Institute of Applied Physical Problems, Belarusian State University, 7 Kurčatava Street, Minsk 220045, Belarus
  • Olga V. Korolik Belarusian State University, 4 Niezaliežnasci Avenue, Minsk 220030, Belarus
  • Peter I. Gaiduk Belarusian State University, 4 Niezaliežnasci Avenue, Minsk 220030, Belarus

Keywords:

epitaxial structures SiC/Si, vacuum carbidisation, rapid thermal processing, thin films
Supporting Agencies
This work was supported by the framework of the project T22-030 of the Belarusian Republican Foundation for Fundamental Research, as well as, in part, the project 3.1.2 of the state program of scientific research «Photonics and electronics for innovation» (No. 20212702).

Abstract

The results of a study of the structure and phase composition of epitaxial layers of silicon carbide (SiC) formed on silicon substrate with orientation (100) under rapid vacuum thermal processing are presented. Planar-view transmission electron microscopy investigation revealed the formation of epitaxial layers of cubic polytype SiC (3C-SiC) on silicon in the process of carbidisation at 1100 °C during 30 s, using a gas mixture of propane (10 %) and argon (90 %) as a carbon source. The formation of a monocrystalline 3C-SiC with polycrystalline inclusions and twins on all possible planes {111} was found. A rather narrow band of 793 cm–1 transverse optical phonon mode SiC on Raman spectra confirms the formation of a cubic polytype SiC. It is noted that the presence of a 180 cm–1 spectral line and a 793 cm–1 half-width band on Raman spectra indicate the presence of deformation defects in SiC.

Author Biographies

  • Mikhail V. Lobanok, Belarusian State University, 4 Niezaliežnasci Avenue, Minsk 220030, Belarus

    postgraduate student at the department of physical electronics and nanotechnologies, faculty of radiophysics and computer technologies

  • Stanislau L. Prakopyeu, Belarusian State University, 4 Niezaliežnasci Avenue, Minsk 220030, Belarus

    senior lecturer at the department of physical electronics and nanotechnologies, faculty of radiophysics and computer technologies

  • Maksim  A. Makhavikou, A. N. Sevchenko Institute of Applied Physical Problems, Belarusian State University, 7 Kurčatava Street, Minsk 220045, Belarus

    researcher at the laboratory of elionics

  • Olga V. Korolik, Belarusian State University, 4 Niezaliežnasci Avenue, Minsk 220030, Belarus

    PhD (physics and mathematics); head of the laboratory of energy-efficient materials and technologies, department of energy physics, faculty of physics

  • Peter I. Gaiduk, Belarusian State University, 4 Niezaliežnasci Avenue, Minsk 220030, Belarus

    doctor of science (physics and mathematics); professor at the department of physical electronics and nanotechnologies, faculty of radiophysics and computer technologies

References

  1. Ferro G. 3C-SiC heteroepitaxial growth on silicon: the quest for holy grail. Critical Reviews in Solid State and Materials Sciences. 2015;40(1):56–76. DOI: 10.1080/10408436.2014.940440.
  2. Shenai K, Scott RS, Baliga BJ. Optimum semiconductors for high-power electronics. IEEE Transactions on Electron Devices. 1989;36(9):1811–1823. DOI: 10.1109/16.34247.
  3. Aldalbahi A, Li E, Rivera M, Velazquez R. A new approach for fabrications of SiC based photodetectors. Scientific Reports. 2016;6(1):23457. DOI: 10.1038/srep23457.
  4. Skibarko IA, Milchanin OV, Gaiduk PI, Komarov FF, Marks J, Pastuszka B, et al. Structural and optical properties of GaN/SiC/Si heterostructures grown by MBE. In: Ploog KH, Tränkle G, Weimann G, editors. Compound semiconductors – 1999. Proceedings of the 26th International symposium on compound semiconductors; 1999 August 22–26; Berlin, Germany. Bristol: IOP Publishing; 2000. p. 465–469 (Institute of Physics conference series; no. 166).
  5. Shakir M, Hou S, Hedayati R, Malm BG, Östling M, Zetterling C-M. Towards silicon carbide VLSI circuits for extreme environment applications. Electronics. 2019;8(5):496. DOI: 10.3390/electronics8050496.
  6. Zimbone M, Sarikov A, Bongiorno C, Marzegalli A, Scuderi V, Calabretta C, et al. Extended defects in 3C-SiC: stacking faults, threading partial dislocations, and inverted domain boundaries. Acta Materialia. 2021;213:116915. DOI: 10.1016/j.actamat.2021.116915.
  7. Bosi M, Ferrari C, Nilsson D, Ward PJ. 3C-SiC carbonization optimization and void reduction on misoriented Si substrates: from a research reactor to a production scale reactor. CrystEngComm. 2016;18(39):7478–7486. DOI: 10.1039/c6ce01388k.
  8. Zimbone M, Mauceri M, Litrico G, Barbagiovanni EG, Bongiorno C, La Via F. Protrusions reduction in 3C-SiC thin film on Si. Journal of Crystal Growth. 2018;498:248–257. DOI: 10.1016/j.jcrysgro.2018.06.003.
  9. Cimalla V, Pezoldt J, Ecke G, Eichhorn G. The buffer layer in RTCVD of SiC. In: Nakashima S, Matsunami H, Yoshida S, Harima H, editors. Silicon carbide and related materials – 1995. Proceedings of the 6th International conference on silicon carbide and related materials; 1995 September 18–21; Kyoto, Japan. Bristol: IOP Publishing; 1996. p. 153–156 (Institute of Physics conference series; no. 142).
  10. Steckl AJ, Li JP. Epitaxial growth of beta-SiC on Si by RTCVD with C3H8 and SiH4. IEEE Transactions on Electron Devices. 1992;39:64–74. DOI: 10.1109/16.108213.
  11. Ottaviani L, Lazar M, Locatelli ML, Chante JP, Heera V, Skorupa W, et al. Annealing studies of Al-implanted 6H-SiC in an induction furnace. Materials Science and Engineering: B. 2002;91–92:325–328. DOI: 10.1016/S0921-5107(01)01043-1.
  12. Wang Z, Liu W, Wang C. Recent progress in ohmic contacts to silicon carbide for high-temperature applications. Journal of Electronic Materials. 2016;45:267–284. DOI: 10.1007/s11664-015-4107-8.
  13. Roccaforte F, Brezeanu G, Ganmon PM, Giannazzo F, Rascuna S, Saggio M. Schottky contacts to silicon carbide: physics, technology and applications. In: Zekentes K, Vasilevskiy K, editors. Advancing silicon carbide electronics technology I. Metal contacts to silicon carbide: physics, technology, applications. Chapter 3. Millersville: Materials Research Forum LLC; 2018. p. 127–190. DOI: 10.21741/9781945291852-3.
  14. Skorupa W, Panknin D, Anwand W, Voelskow M, Ferro G, Monteil Y, et al. Flash lamp supported deposition of 3C-SiC (FLASiC) – a promising technique to produce high quality cubic SiC layers. Materials Science Forum. 2004;457–460:175–180. DOI: 10.4028/www.scientific.net/MSF.457-460.175.
  15. Booker GR. Crystallographic imperfections in silicon. Discussions of the Faraday Society. 1964;38:298–304. DOI: 10.1039/ DF9643800298.
  16. Komarov FF, Solov’yev VS, Tishkov VS, Shiryayev SY. Thermal recrystallization of silicon amorphous layers after argon, oxygen and nitrogen ion implantation. Radiation Effects. 1983;69(3–4):179–189. DOI: 10.1080/00337578308217822.
  17. Aksyanov IG, Kompan ME, Kul’kova IV. [Raman scattering in mosaic silicon carbide films]. Fizika tverdogo tela. 2010;52(9): 1724–1728. Russian.
  18. Sorieul S, Costantini J-M, Gosmain L, Thomé L, Grob J-J. Raman spectroscopy study of heavy-ion-irradiated α-SiC. Journal of Physics: Condensed Matter. 2006;18(22):5235–5251. DOI: 10.1088/0953-8984/18/22/022.
  19. Kazuchits NM, Korolik OV, Rusetsky MS, Kazuchits VN, Kirilkin NS, Skuratov VA. Raman scattering in diamond irradiated with high-energy xenon ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2020;472:19–23. DOI: 10.1016/j.nimb.2020.03.034.
  20. Soldatenko SA, Kuzmina VO. Substructure of the epitaxial film of β-SiC synthesized by pyrolysis of methane on (111) Si by the method of PPT [Internet]. In: Sovremennye metody i tekhnologii sozdaniya i obrabotki materialov. Materialy XIII Mezhdunarodnoi nauchno-tekhnicheskoi konferentsii; 12–14 sentyabrya 2018 g.; Minsk, Belarus’ [Modern methods and technologies for the creation and processing of materials. Proceedings of the 13th International scientific and technical conference; 2018 September 12–14; Minsk, Belarus]. Minsk: [s. n.]; 2018 [cited 2022 March 21]. p. 169–175. Russian. Available from: https://rep.bntu.by/handle/data/51257.

Downloads

Published

2022-06-08

Issue

Section

Semiconductor Physics and Engineering

How to Cite

(1)
Lobanok, M. V. .; Prakopyeu, S. L. .; Makhavikou, M.  A. .; Korolik, O. V. .; Gaiduk, P. I. . Formation of Epitaxial 3C-SiC Layers on Si by Rapid Vacuum Thermal Processing. Журнал Белорусского государственного университета. Физика 2022, No. 2, 79-86. https://doi.org/10.33581/2520-2243-2022-2-79-86.