Kovalchuk, N. S. .; Marudo, Y. A. .; Omelchenko, A. A. .; Pilipenka, U. A. .; Saladukha, V. A. .; Demidovich, S. A. .; Kolos, V. V. .; Anishchik, V. M. .; Filipenia, V. A. .; Shestovski, D. V. . Charging Properties of Thin Gate Dielectrics, Obtained by the Method of Rapid Thermal Processing. Журнал Белорусского государственного университета. Физика 2022, No. 1, 80-87. https://doi.org/10.33581/2520-2243-2022-1-80-87.